SHETIME WAF08-T1T1-2021-A

Name: SHETIME WAF08-T1T1-2021-A
Brand: Shenzhen ECER Network Technology Co., Ltd.
SKU: WAF08-T1T1-2021-A
Price: Negotiable USD
Availability: InStock

Manufacturer:SHETIME

Model Number:WAF08-T1T1-2021-A

Minimum Order Quantity:2000

Standard Packaging:SMD,P=1.25mm,Surface Mount,Right Angle

Delivery Time:3-5 working days

Product Details

Y-Width Of Bottom Edge On Board: 5.45mm

Contact Material: Copper;LCP

Color: Beige

Flame Retardant Rating: UL94V-0

Number Of Rows: 1

Mounting Type: Surface Mount, Right Angle

Pitch: 1.25mm

Number Of PINs: 8P

Operating Temperature: -25℃~+85℃

Number Of PINs Per Row: 8

Current Rating: 1A

Contact Plating: Tin

X-Length Of Bottom Edge On Board (Spacing Line): 14.7mm

Voltage Rating (Max): 125V

Z-Height Of The Board: 3.45mm

Product Description

Detailed Specifications & Features

Product Overview

This product appears to be a set of electrical connectors undergoing various durability and performance tests. The tests cover aspects like contact resistance, vibration resistance, thermal aging, insulation resistance, mechanical strength (crimping, insertion/withdrawal forces), temperature rise, humidity, and temperature cycling.

Application Scenarios

These tests are typical for electronic components used in applications requiring high reliability and endurance under various environmental and operational conditions.

Brand N/A

Origin N/A

Material N/A

Color N/A

Certifications N/A

Test Item	Test Mode	Requirement	Measurement/Result
Durability	Mate connectors up to 30 cycles at a maximum rate of 10 cycles per minute prior to environmental test	N/A	N/A
Contact Resistance	N/A	≤ 30mΩ	< 30mΩ
Vibration	Frequency: 10-55-10 Hz/minute (35% sweep) Amplitude: 1.5mm p-p Direction: 3 axes (up/down, left/right, front/back) Period: 2 hours for each direction	No damage, discontinuous current (off) max 1 microsecond	Appearance: No damage Contact Resistance: ≤ 30mΩ Current Discontinuity: Max 1 µsec
Thermal Aging	Connector combination placed in oven at 85 ± 2 °C for 96 hours continuously	Appearance: No damage Contact Resistance: ≤ 30mΩ	Appearance: No damage Contact Resistance: < 30mΩ
Insulation Resistance	Apply 500V DC (rms) for 1 minute between adjacent contacts	> 100 MΩ	> 100 MΩ
Terminal crimping wire strength (AWG#28)	Axial pullout force at a rate of 25 ± 3mm per minute	> 13N	> 13N
Terminal crimping wire strength (AWG#30)	Axial pullout force at a rate of 25 ± 3mm per minute	> 8N	> 8N
Terminal crimping wire strength (AWG#32)	Axial pullout force at a rate of 25 ± 3mm per minute	> 6N	> 6N
Fixed terminals and hole seat	Pull out force at a rate of 25 ± 3mm per minute along the wire direction	Per contact > 8N	Per contact > 8N
Single contact insertion force	Housing with terminal ends matched to wafer, insertion force test at a rate of 25 ± 3mm per minute	≤ 2N	≤ 2N
Single contact withdrawal force	Housing with terminal ends matched to wafer, pull-out test at a rate of 25 ± 3mm per minute	> 0.2N	> 0.2N
Pin Retention force	Force exerted on pin end until needle exits seat, at a rate of 25 ± 3mm per minute	Per contact > 3N	Per contact > 3N
Temperature Rise	Measure temperature rise of contact when maximum rated current is passed	51°C (Max)	N/A
Humidity	Constant temperature and humidity: 40 ± 2 °C, 90-95% RH for 96 hours continuously	Appearance: No damage Contact Resistance: ≤ 30mΩ Insulation Resistance: ≥ 50MΩ Withstand Voltage: No breakdown or flashover	Appearance: No damage Contact Resistance: < 30mΩ Insulation Resistance: ≥ 50MΩ Withstand Voltage: No breakdown or flashover
Temperature Cycling	One cycle: -55+3°C (30min), Room temp. (10-15 min), 85+3°C (30min), Room temp. (10-15 min). Total 5 cycles.	Same as paragraph 8.3 (Assumed to be Contact Resistance, Insulation Resistance, and Withstand Voltage tests)	N/A

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