SHETIME WAF07-T1T1-2020-D
Product Overview
This product undergoes rigorous testing to ensure its durability and performance under various environmental and mechanical conditions. It is designed for applications requiring reliable electrical connections.
| Item | Test Mode | Requirement | Test Description | Parameters | Result |
|---|---|---|---|---|---|
| Durability | Mate connectors up to 30 cycles | Max 10 cycles per minute | Prior to environmental test | ||
| Contact Resistance | <30m | ||||
| Vibration | PR3 | Connector combination state of the welding circuit board as test samples, resistance to vibration test, whether to produce discontinuous current (off). | Frequency: 10-55-10 Hz/minute (35%) Amplitude: 1.5mm p-p (#& &) Direction: Axis of up and down, right to left, front and back (J7 [A]) Period: 2 hours for each direction | Appearance: No damage Contact Resistance: <30m Current Discontinuity: Max 1 microsecond | |
| Thermal Aging | i 1 iR | Connector combination condition is placed in the oven, high temperature aging test, after the test and measurement of contact resistance. | Temperature: 85 2 C Period: 96 hours continuously | Appearance: No damage Contact Resistance: <30m | |
| Insulation Resistance | 2z FfH | More than 100 M | Apply 500V DC (rms) for 1 minute between adjacent contacts to measure the insulation resistance. | ||
| Terminal crimping wire strength | S B SR | More than 13N (AWG#28 wire) More than 8N (AWG#30 wire) More than 6N (AWG#32 wire) | Terminal crimping wires, axial pullout force. | Rate: 25 3mm per minute | |
| Fixed terminals and hole seat | ST 5 FLIEIE 5 | More than 8N per contact | The terminal and the hole seat, pulled out from the hole in the seat capacity. | Rate: 25 3mm along the wire direction | |
| Single contact insertion force | RN S | Less than 2N | The Housing together with the terminal ends with Wafer matched, inserting force test. | Rate: 25 3mm per minute | |
| Single contact withdrawal force | AR ) | More than 0.2N | The Housing together with the terminal ends with Wafer matched, pull-out test. | Rate: 25 3mm per minute | |
| Pin Retention force | PIN [l 52 | More than 3N per contact | Exerts a force on the pin end until the needle exit seat pull-out force. | Rate: 25 3mm per minute | |
| Temperature Rise | B | 5L | Mate connector measure the temperature rise of contact when the maximum rated current is passed. | ||
| Humidity | {5 #IE | Connector combination under constant temperature and humidity, insulation test, after experiment measuring contact resistance, resistance and withstand voltage test. | Temperature: 40 2 C Relative humidity: 90-95% RH Period: 96 hours continuously | Appearance: No damage Contact Resistance: <30m Insulation Resistance: 50M Withstand Voltage: No breakdown or flashover | |
| Temperature cycling | R PETRE | Same as paragraph 8.3 | The combined state of connectors as test samples, thermal shock test, after the test measuring contact resistance, insulation resistance, and resistance to voltage. | One cycle: -55+3C (30min), Room temp. (10-15 min), 85+3C (30min), Room temp. (10-15 min) Total cycle: 5 cycles |
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