SHETIME WAF06-T1T1-2020-D
Product Overview
This document outlines the test modes and requirements for connector performance, including durability, contact resistance, vibration, thermal aging, insulation resistance, mechanical performance, temperature rise, humidity, and temperature cycling tests. These tests ensure the reliability and performance of the connectors under various environmental and operational conditions.
Technical Specifications
| Item | Test Mode | Requirement | Test Description | Specification |
|---|---|---|---|---|
| Durability | Mate connectors up to 30 cycles at a maximum rate of 10 cycles per minute prior to environmental test | N/A | N/A | N/A |
| Contact Resistance | N/A | <30m | N/A | N/A |
| Vibration | Frequency: 10-55-10 Hz/minute Amplitude: 1.5mm p-p Direction: Axis of up/down, right/left, front/back Period: 2 hours for each direction | Connector combination state of the welding circuit board as test samples, resistance to vibration test, whether to produce discontinuous current (off) | Appearance: No damage Contact Resistance: <30m Current Discontinuity: Max 1 microsecond | N/A |
| Thermal Aging | Temperature: 85 2 C Period: 96 hours continuously | Connector combination condition is placed in the oven, high temperature aging test | Appearance: No damage Contact Resistance: <30m | N/A |
| Insulation Resistance | Apply 500V DC (rms) for 1 minute between adjacent contacts | >100 M | N/A | N/A |
| Mechanical Performance | Terminal crimping wire strength (AWG#28 wire) | >13N | Terminal crimping wires, axial pullout force | N/A |
| Terminal crimping wire strength (AWG#30 wire) | >8N | Terminal crimping wires, axial pullout force | N/A | |
| Terminal crimping wire strength (AWG#32 wire) | >6N | Terminal crimping wires, axial pullout force | N/A | |
| Mechanical Performance | Fixed terminals and hole seat | >8N per contact | The terminal and the hole seat, pulled out from the hole in the seat capacity | N/A |
| Mechanical Performance | Single contact insertion force | <2N | Housing with terminal ends matched with wafer, inserting force test | N/A |
| Mechanical Performance | Single contact withdrawal force | >0.2N | Housing with terminal ends matched with wafer, pull-out test | N/A |
| Mechanical Performance | Pin Retention force | >3N per contact | Force on pin end until needle exits seat | N/A |
| Temperature Rise | Maximum rated current | N/A | Mate connector measure the temperature rise of contact | 5L (Unit unclear) |
| Humidity | Temperature: 40 2 C Relative humidity: 90-95%RH Period: 96 hours continuously | Connector combination under constant temperature and humidity conditions | Appearance: No damage Contact Resistance: <30m Insulation Resistance: >50M Withstand Voltage: No breakdown or flashover | N/A |
| N/A | N/A | N/A | N/A | |
| Temperature Cycling | One cycle: -55+3C (30min), Room temp. (10-15 min); 85+3C (30min), Room temp. (10-15 min). Total cycle: 5 cycles. | Thermal shock test | Same as paragraph 8.3 (Details not provided in input) | N/A |
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